HIOKI officially launches the CT6704 and CT6705 current probes for current waveform measurement in high-frequency and high-current applications.
Designed for the R&D and evaluation market of power electronics, mobility, industrial equipment and data center devices, these probes enable current waveform observation on SiC/GaN inverters, DC/DC converters, motor drive circuits, high-frequency power supplies, battery backup units and more.
With these new probes, HIOKI will strengthen its measurement solution offerings for fast-growing markets where power conversion technologies are critical, including electrification, renewable energy and data centers.
Suitable for long-duration waveform capture and evaluation environments with temperature fluctuations
Adopting the fluxgate sensing method, the probes effectively suppress zero drift caused by self-heating of the sensor. They deliver stable current waveform measurement even during long-term waveform recording or in evaluation environments with varying temperatures.
The newly designed sensor magnetic core reduces induced heating generated during high-frequency, high-current measurement. Meanwhile, the usable operating range under frequency derating conditions is expanded, ensuring stable measurement even under harsh test conditions.
The CT6704 features a bandwidth of DC to 30 MHz, while the CT6705 covers DC to 15 MHz. They support observation of steep current transitions and transient responses within SiC/GaN inverters, DC/DC converters, motor drive circuits and other devices.
Equipped with a BNC connector, the probes are compatible with all types of oscilloscopes and HIOKI MR6000 memory hi-loggers. Brand-agnostic, they can be seamlessly integrated into existing measurement setups.
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